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Understanding the Basic Advantages of Bulk FinFETs for Sub- and Near-Threshold Logic Circuits From Device Measurements

✍ Scribed by Crupi, F.; Alioto, M.; Franco, J.; Magnone, P.; Togo, M.; Horiguchi, N.; Groeseneken, G.


Book ID
115495810
Publisher
Institute of Electrical and Electronics Engineers
Year
2012
Tongue
English
Weight
246 KB
Volume
59
Category
Article
ISSN
1549-7747

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