Understanding quasi-ballistic transport in nano-MOSFETs: part II-Technology scaling along the ITRS

✍ Scribed by Eminente, S.; Esseni, D.; Palestri, P.; Fiegna, C.; Selmi, L.; Sangiorgi, E.

• Book ID: 114618016
• Publisher: IEEE
• Year: 2005
• Tongue: English
• Weight: 538 KB
• Volume: 52
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2005.859566