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Understanding defects in semiconductors as key to advancing device technology

✍ Scribed by Eicke R Weber

Book ID: 103884822
Publisher: Elsevier Science
Year: 2003
Tongue: English
Weight: 264 KB
Volume: 340-342
Category: Article
ISSN: 0921-4526
DOI: 10.1016/j.physb.2003.10.001

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