Uncertainties associated with many-port (>4) S-parameter measurements using a four-port vector network analyzer

✍ Scribed by Martens, J.; Judge, D.V.; Bigelow, J.A.

• Book ID: 114660030
• Publisher: IEEE
• Year: 2004
• Tongue: English
• Weight: 234 KB
• Volume: 52
• Category: Article
• ISSN: 0018-9480
• DOI: 10.1109/tmtt.2004.826997