## Abstract A standard sol‐gel method was used to deposit ZnO thin films of suitable thickness on glass substrate.The optical characteristics of the visible to infrared range on thermal stress were critically observed. Morphological signature of the films was detected by X‐ray diffraction (XRD) an
Ultraviolet photoconductive detector based on Al doped ZnO films prepared by sol–gel method
✍ Scribed by Zi-Qiang Xu; Hong Deng; Juan Xie; Yan Li; Xiao-Tao Zu
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 346 KB
- Volume
- 253
- Category
- Article
- ISSN
- 0169-4332
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