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Ultrastable Substrates for Surface-Enhanced Raman Spectroscopy: Al 2 O 3 Overlayers Fabricated by Atomic Layer Deposition Yield Improved Anthrax Biomarker Detection

✍ Scribed by Zhang, Xiaoyu; Zhao, Jing; Whitney, Alyson V.; Elam, Jeffrey W.; Van Duyne, Richard P.


Book ID
120879153
Publisher
American Chemical Society
Year
2006
Tongue
English
Weight
296 KB
Volume
128
Category
Article
ISSN
0002-7863

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