Ultrafast optics establishes metrological standards in high-frequency electronics

✍ Scribed by M. Bieler; M. Spitzer; G. Hein; U. Siegner; E.O. Göbel

• Publisher: Springer
• Year: 2004
• Tongue: English
• Weight: 223 KB
• Volume: 78
• Category: Article
• ISSN: 1432-0630
• DOI: 10.1007/s00339-003-2399-7