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Ultra-Shallow Chemical Characterization of Organic Thin Films Deposited by Plasma and Vacuum-Ultraviolet, Using Angle- and Excitation Energy-Resolved XPS

✍ Scribed by Pierre-Luc Girard-Lauriault; Juan-Carlos Ruiz; Thomas Gross; Michael R. Wertheimer; Wolfgang E. S. Unger


Book ID
106491103
Publisher
Springer
Year
2011
Tongue
English
Weight
634 KB
Volume
31
Category
Article
ISSN
0272-4324

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