Ultra-low-energy electron scattering cross section measurements of Ar, Kr and Xe employing the threshold photoelectron source

✍ Scribed by Kitajima, M.; Kurokawa, M.; Kishino, T.; Toyoshima, K.; Odagiri, T.; Kato, H.; Anzai, K.; Hoshino, M.; Tanaka, H.; Ito, K.

• Book ID: 114995197
• Publisher: Springer
• Year: 2012
• Tongue: English
• Weight: 542 KB
• Volume: 66
• Category: Article
• ISSN: 1434-6060
• DOI: 10.1140/epjd/e2012-20629-0