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Ultra Low Background Cryogenic Test Facility for Far-Infrared Radiation Detectors

✍ Scribed by Jochem Baselmans; Stephen Yates; Pascale Diener; Pieter de Visser

Book ID: 113071578
Publisher: Springer US
Year: 2012
Tongue: English
Weight: 440 KB
Volume: 167
Category: Article
ISSN: 0022-2291
DOI: 10.1007/s10909-012-0511-0

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