𝔖 Bobbio Scriptorium

✦ LIBER ✦

U. S. Army Advancement in Transistor Reliability Through Manufacturing Process Improvements

✍ Scribed by Hakim, E. B.; Reich, B.

Book ID: 117932797
Publisher: IEEE
Year: 1965
Tongue: English
Weight: 823 KB
Volume: R-14
Category: Article
ISSN: 0018-9529
DOI: 10.1109/tr.1965.5214883

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