Two Simple Methods For The Measurement Of The Dielectric Permittivity Of Low-Loss Microstrip Substrates

✍ Scribed by Pannell, R.M.; Jervis, B.W.

• Book ID: 114657677
• Publisher: IEEE
• Year: 1981
• Tongue: English
• Weight: 333 KB
• Volume: 29
• Category: Article
• ISSN: 0018-9480
• DOI: 10.1109/tmtt.1981.1130362