Two-photon fluorescence scanning near-field microscopy based on a focused evanescent field under total internal reflection

✍ Scribed by Chon, James W. M.; Gu, Min; Bullen, Craig; Mulvaney, Paul

• Book ID: 115426209
• Publisher: Optical Society of America
• Year: 2003
• Tongue: English
• Weight: 917 KB
• Volume: 28
• Category: Article
• ISSN: 0146-9592
• DOI: 10.1364/OL.28.001930