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Two-Phase Coexistence in CMR Manganite Thin Films

✍ Scribed by K. Miyano; N. Takubo; K. Munakata


Publisher
Springer
Year
2007
Tongue
English
Weight
231 KB
Volume
20
Category
Article
ISSN
0896-1107

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## Abstract Two coexisting mechanisms, i.e., electrohydrodynamic destabilization and electrostatic detachment, for polymer nanostructuring in field‐assisted atomic force microscope nanolithography are presented. The electrohydrodynamic destabilization mechanism is based on the surface instability o