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Two mechanisms of crater formation in ultraviolet-pulsed-laser irradiated SiO[sub 2] thin films with artificial defects

✍ Scribed by Papernov, S.; Schmid, A. W.


Book ID
120365072
Publisher
American Institute of Physics
Year
2005
Tongue
English
Weight
774 KB
Volume
97
Category
Article
ISSN
0021-8979

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