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Two kinds of defect centers observed in sin films prepared by ECR plasma CVD method

✍ Scribed by T. Izumi; M. Shibuya; T. Matsumori; T. Hirao; T. Kamada


Book ID
113280171
Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
349 KB
Volume
39
Category
Article
ISSN
0168-583X

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