Two-dimensional profiling of carriers in terahertz quantum cascade lasers using calibrated scanning spreading resistance microscopy and scanning capacitance microscopy

Development and optimization of scanning

Development and optimization of scanning spreading resistance microscopy for measuring the two-dimensional carrier profile in solar cell structures

✍ Eyben, Pierre ;Seidel, Felix ;Hantschel, Thomas ;Schulze, Andreas ;Lorenz, Anne 📂 Article 📅 2010 🏛 John Wiley and Sons 🌐 English ⚖ 279 KB

## Abstract Within this work, we have explored the use of scanning spreading resistance microscopy (SSRM) on advanced solar cell structures. Three main topics, corresponding to three important needs, were targeted. First, we have analyzed the highly doped regions at the frontside of solar cells. Th