✦ LIBER ✦
Two-dimensional imaging of cleaved Si p-n junctions with 30-nm resolution using a UHV scanning tunneling microscope
✍ Scribed by Kordic, S.; van Loenen, E.J.; Walker, A.J.
- Book ID
- 121307255
- Publisher
- IEEE
- Year
- 1991
- Tongue
- English
- Weight
- 412 KB
- Volume
- 12
- Category
- Article
- ISSN
- 0741-3106
No coin nor oath required. For personal study only.