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Two-color optical technique for characterization of x-ray radiation-enhanced electron transport in SiO[sub 2]

✍ Scribed by Marka, Z.; Pasternak, R.; Albridge, R. G.; Rashkeev, S. N.; Pantelides, S. T.; Tolk, N. H.; Choi, B. K.; Fleetwood, D. M.; Schrimpf, R. D.


Book ID
120543101
Publisher
American Institute of Physics
Year
2003
Tongue
English
Weight
439 KB
Volume
93
Category
Article
ISSN
0021-8979

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