Strain relaxation and formation of screw
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M. Bauer; F. Baudenbacher; H. Kinder
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Article
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1995
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Elsevier Science
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English
โ 468 KB
We have studied the growth of the first monolayers of YBa2Cu307 (YBCO) films on MgO substrates by reflection high-energy electron diffraction (RHEED), atomic force and scanning tunneling microscopy (AFM, STM) and scanning electron microscopy (SEM). Up to a nominal thickness of 1.5 nm we find island