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Tunneling escape time from a semiconductor quantum well in an electric field

✍ Scribed by Larkin, I. A.; Ujevic, Sebastian; Avrutin, E. A.

Book ID
120808333
Publisher
American Institute of Physics
Year
2009
Tongue
English
Weight
466 KB
Volume
106
Category
Article
ISSN
0021-8979

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By considering the time variation of band-edge profile arising from the decay of injected charge in quantum wells(QWs), we employ a wave packet method to verify that the actual escape time of certain amount of electrons from QWs could be much larger than that for a single electron. The theoretical r