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Tunneling escape rate in dc-biased periodic multibarrier semiconductor heterostructures

✍ Scribed by R. Biswas; C. Sinha; P. Panchadhyayee; P.K. Mahapatra


Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
238 KB
Volume
405
Category
Article
ISSN
0921-4526

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