✦ LIBER ✦
Tunneling Atomic Force Microscopy Studies on Surface Growth Pits Due to Dislocations in 4H-SiC Epitaxial Layers
✍ Scribed by Noboru Ohtani, Shoji Ushio, Tadaaki Kaneko, Takashi Aigo, Masakazu Katsuno, Tatsuo Fujimoto, Wataru Ohashi
- Book ID
- 113087419
- Publisher
- Springer US
- Year
- 2012
- Tongue
- English
- Weight
- 456 KB
- Volume
- 41
- Category
- Article
- ISSN
- 0361-5235
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