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Truncation in diffraction pattern analysis. I. Concept of a diffraction line profile and its range

โœ Scribed by Delhez, R. ;de Keijser, Th. ;Mittemeijer, E. J. ;Langford, J. I.


Book ID
114499824
Publisher
International Union of Crystallography
Year
1986
Tongue
English
Weight
770 KB
Volume
19
Category
Article
ISSN
0021-8898

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