True atomic resolution under ambient conditions obtained by atomic force microscopy in the contact mode

✍ Scribed by T. Schimmel; T. Koch; J. Küppers; M. Lux-Steiner

• Book ID: 106023505
• Publisher: Springer
• Year: 1999
• Tongue: English
• Weight: 512 KB
• Volume: 68
• Category: Article
• ISSN: 1432-0630
• DOI: 10.1007/s003390050912