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Triple ion beam cutting of diamond/Al composites for interface characterization

✍ Scribed by Ji, Gang; Tan, Zhanqiu; Shabadi, Rajashekhara; Li, Zhiqiang; Grünewald, Wolfgang; Addad, Ahmed; Schryvers, Dominique; Zhang, Di

Book ID
121951743
Publisher
Elsevier Science
Year
2014
Tongue
English
Weight
823 KB
Volume
89
Category
Article
ISSN
1044-5803

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Ion beam analysis (IBA) methods were used for the characterization of interdiffusion in thin Au-A1 multilayered systems. Conventional RBS with a high depth resolution at the specimen surface and at the interfaces (e.g. 14 nm in the depth of 255 nm) was used for gold depth profiling. In contrast to g