✦ LIBER ✦
Triple-crystal diffractometry, x-ray standing wave and reciprocal space mapping study of homoepitaxial grown Si layers
✍ Scribed by Mukhamedzhanov, E; Kummer, M; Dommann, A
- Book ID
- 121877048
- Publisher
- Institute of Physics
- Year
- 2000
- Tongue
- English
- Weight
- 151 KB
- Volume
- 33
- Category
- Article
- ISSN
- 0022-3727
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