AFM investigation of tribological proper
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D. Marchetto; A. Rota; L. Calabri; G.C. Gazzadi; C. Menozzi; S. Valeri
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Article
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2008
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Elsevier Science
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English
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The tribological properties of a nano-patterned Si surface have been investigated in ambient condition by atomic force microscopy (AFM). The pattern, consisting of parallel grooves, was realized on a Si(0 0 1) single crystal via focused ion beam (FIB) milling. The same technique was used to modify a