Internal interfaces are of intrinsic importance to the properties of all materials, and the link between their structure and properties continues to be an active field of research in materials science. Electron microscopy offers several techniques that provide an unparalleled degree of detail in the
Tribochemical characterization of the lubrication film at the Si3N4Si3N4 interface sliding in aqueous solutions
β Scribed by F. Honda; T. Saito
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 402 KB
- Volume
- 92
- Category
- Article
- ISSN
- 0169-4332
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Silicon nitride layers of 140 nm thickness were deposited on silicon wafers by low pressure chemical vapour deposition (LPCVD) and irradiated at GANIL with Pb ions of 110 MeV up to a maximum fluence of 4 Γ 10 13 cm Γ2 . As shown in a previous work these irradiation conditions, characterized by a pre