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Trends in the ultimate breakdown strength of high dielectric-constant materials

โœ Scribed by McPherson, J.W.; Jinyoung Kim; Shanware, A.; Mogul, H.; Rodriguez, J.


Book ID
114617175
Publisher
IEEE
Year
2003
Tongue
English
Weight
760 KB
Volume
50
Category
Article
ISSN
0018-9383

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