✦ LIBER ✦
Traps identification in silicon nanocrystals memories by low noise technique
✍ Scribed by Ne. Sghaier; Na. Sghaier; M. Troudi; L. Militaru; A. Kalboussi; A. Souifi
- Publisher
- Elsevier Science
- Year
- 2008
- Tongue
- English
- Weight
- 465 KB
- Volume
- 28
- Category
- Article
- ISSN
- 0928-4931
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