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Trapping Parameters of Electronic Defectes States in Indium Tin Oxide from AC Conductivity

✍ Scribed by Salam, R.

Book ID
105381836
Publisher
John Wiley and Sons
Year
1990
Tongue
English
Weight
330 KB
Volume
117
Category
Article
ISSN
0031-8965

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This work was financially supported by DFG and Evonik Degussa GmbH (contract number GRK 1161). The work of Mrs. Mertens and Mrs. Hildebrand who carried out the XRD-and XPS-measurements is gratefully acknowledged.