✦ LIBER ✦
Trapping and Reliability Assessment in D-Mode GaN-Based MIS-HEMTs for Power Applications
✍ Scribed by Meneghini, Matteo; Bisi, Davide; Marcon, Denis; Stoffels, Steve; Van Hove, Marleen; Wu, Tian-Li; Decoutere, Stefaan; Meneghesso, Gaudenzio; Zanoni, Enrico
- Book ID
- 126507828
- Publisher
- IEEE
- Year
- 2014
- Tongue
- English
- Weight
- 823 KB
- Volume
- 29
- Category
- Article
- ISSN
- 0885-8993
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