𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Trapped-ion probing of light-induced charging effects on dielectrics

✍ Scribed by Harlander, M; Brownnutt, M; Hänsel, W; Blatt, R

Book ID
111860213
Publisher
Institute of Physics
Year
2010
Tongue
English
Weight
923 KB
Volume
12
Category
Article
ISSN
1367-2630

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

The assessment of microscopic charging e
The assessment of microscopic charging effects induced by focused electron and ion beam irradiation of dielectrics
✍ Marion A. Stevens-Kalceff; Katie J. Levick 📂 Article 📅 2007 🏛 John Wiley and Sons 🌐 English ⚖ 358 KB

## Abstract Energetic beams of electrons and ions are widely used to probe the microscopic properties of materials. Irradiation with charged beams in scanning electron microscopes (SEM) and focused ion beam (FIB) systems may result in the trapping of charge at irradiation induced or pre‐existing de