Trapped charge dynamics in a sol–gel based TiO 2 high- k gate dielectric silicon metal–oxide–semiconductor field effect transistor

✍ Scribed by Khan, M Ziaur Rahman; Hasko, D G; Saifullah, M S M; Welland, M E

• Book ID: 127236911
• Publisher: Institute of Physics
• Year: 2009
• Tongue: English
• Weight: 669 KB
• Volume: 21
• Category: Article
• ISSN: 0953-8984
• DOI: 10.1088/0953-8984/21/21/215902