✦ LIBER ✦
Trapped charge distributions in thin (10 nm) SiO2 films subjected to static and dynamic stresses
✍ Scribed by Rodriguez, R.; Nafria, M.; Sune, J.; Aymerich, X.
- Book ID
- 114537238
- Publisher
- IEEE
- Year
- 1998
- Tongue
- English
- Weight
- 116 KB
- Volume
- 45
- Category
- Article
- ISSN
- 0018-9383
No coin nor oath required. For personal study only.