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Transport coefficients calculated by means of a relativistic extension of Enskog's method

โœ Scribed by W.A. van Leeuwen; P.H. Polak; S.R. de Groot


Publisher
Elsevier Science
Year
1971
Tongue
English
Weight
120 KB
Volume
37
Category
Article
ISSN
0375-9601

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The problem of calculating photo- and electro-reflectance spectra from weakly inhomogeneous layers of semiconductor heterostructures is solved by combining two former approaches; the transfer matrix method and the perturbation theoretical treatment of the weak inhomogeneity. The electric field profi