Transmission-line matrix models for solving transient problems of diffusion with recombination
β Scribed by Xiang Gui; Donard de Cogan
- Publisher
- John Wiley and Sons
- Year
- 2003
- Tongue
- English
- Weight
- 238 KB
- Volume
- 16
- Category
- Article
- ISSN
- 0894-3370
- DOI
- 10.1002/jnm.511
No coin nor oath required. For personal study only.
β¦ Synopsis
Abstract
Starting from the general telegrapher's equation, we investigate two nodal network constructions for modelling diffusion with recombination by means of the transmissionβline matrix (TLM) method. The diffusion effect is modelled by the series and shunt capacitance in one approach, and by the series inductance and shunt resistance in the other. Both approaches use the series and shunt resistances to model the recombination effect. The constraint of using both TLM networks for solving transient problems of diffusion with recombination is found to be identical in terms of the physics behind the numerical routines. A practical way of determining the spatial resolution and iteration time step for accurate TLM numerical computations is suggested based on a simple frequency analysis. Copyright Β© 2003 John Wiley & Sons, Ltd.
π SIMILAR VOLUMES
## Abstract A stub leakage resistor at the nodes of an otherwise lossless TLM chain (i.e. without series resistors) introduces losses, although the corresponding absorption term in the Telegraphers' equation vanishes due to the absence of series resistors. This contradiction is outlined, an explana