Transmission electron microscopy studies of growth and interface structure of chemically vapour deposited TiC and TiN films on WCCo alloy subsrates

✍ Scribed by J. Echigoya; Zheng-Tang Liu; A. Imamura; S. Takatsu

• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 658 KB
• Volume: 198
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/0040-6090(91)90347-z