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Transmission electron microscopy of wear tracks

โœ Scribed by R. Feder; P. Chaudhari


Publisher
Elsevier Science
Year
1972
Tongue
English
Weight
570 KB
Volume
19
Category
Article
ISSN
0043-1648

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Transmission electron microscopy (TEM) and its facility for electron diffraction has long been a key technique in materials science. Its use for characterization of pharmaceutical samples has, however, been very limited, largely due to the difficulties associated with the preparation of appropriatel