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Transmission electron microscopy of GaN layers in-situ doped with Er during plasma assisted MBE

✍ Scribed by T. Wojtowicz; P. Ruterana; D. S. Lee; A. J. Steckl


Publisher
John Wiley and Sons
Year
2005
Tongue
English
Weight
542 KB
Volume
2
Category
Article
ISSN
1862-6351

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