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Transmission electron microscopy evidence for dislocation dissociation and stacking faults in niobium

✍ Scribed by Chung-Ping Chang; C.W. Chen

Book ID: 116058832
Publisher: Elsevier Science
Year: 1975
Weight: 628 KB
Volume: 9
Category: Article
ISSN: 0036-9748
DOI: 10.1016/0036-9748(75)90161-1

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