✦ LIBER ✦
Transmission electron microscopy characterization of the erbium silicide formation process using a Pt/Er stack on a silicon-on-insulator substrate
✍ Scribed by A. ŁASZCZ; J. KĄTCKI; J. RATAJCZAK; XIAOHUI TANG; E. DUBOIS
- Book ID
- 108864244
- Publisher
- John Wiley and Sons
- Year
- 2006
- Tongue
- English
- Weight
- 129 KB
- Volume
- 224
- Category
- Article
- ISSN
- 0022-2720
No coin nor oath required. For personal study only.