✦ LIBER ✦
Transmission Electron Microscopy-Based Analysis of Electrically Conductive Surface Defects in Large Area GaSb Homoepitaxial Diodes Grown Using Molecular Beam Epitaxy
✍ Scribed by Romero, O.S.; Aragon, A.A.; Rahimi, N.; Shima, D.; Addamane, S.; Rotter, T.J.; Mukherjee, S. D.; Dawson, L.R.; Lester, L.F.; Balakrishnan, G.
- Book ID
- 125373863
- Publisher
- Springer US
- Year
- 2014
- Tongue
- English
- Weight
- 860 KB
- Volume
- 43
- Category
- Article
- ISSN
- 0361-5235
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