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Transmission electron microscopy and scanning electron microscopy characterization of GaP grown by metal-organic chemical vapor deposition on silicon substrates

✍ Scribed by M.M. Al-Jassim

Publisher: Elsevier Science
Year: 1987
Weight: 98 KB
Volume: 21
Category: Article
ISSN: 0379-6787
DOI: 10.1016/0379-6787(87)90166-9

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