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Transmission Electron Microscope Study of Natural Radiation Damage in Zircon (ZrSiO4)

✍ Scribed by L. A. Bursill; A. C. McLaren


Publisher
John Wiley and Sons
Year
1966
Tongue
English
Weight
933 KB
Volume
13
Category
Article
ISSN
0370-1972

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Electron radiation damage in Cu(In,Ga)Se
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## Abstract This contribution describes the first results of a completely new approach to study in‐situ the radiation damage properties of semiconductors, particularly of Cu(In,Ga)Se~2~ thin solar films by cathodoluminescence in TEM. This method proved to be sensitive to the initial damage processe