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Transmission electron microscope study of ion and electron beam induced structural changes in a-Ge0.25 Se0.75 inorganic resist thin films

✍ Scribed by Balasubramanyam, K.


Book ID
120013463
Publisher
American Institute of Physics
Year
1982
Tongue
English
Weight
563 KB
Volume
53
Category
Article
ISSN
0021-8979

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