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Transmission electron microscope in-situ observations of twinning in the lamellar microstructure in a TiAl based alloy

✍ Scribed by X.K. Meng; Z.G. Liu


Book ID
119125602
Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
272 KB
Volume
25
Category
Article
ISSN
0167-577X

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