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Transition metal oxides as charge injecting layer for admittance spectroscopy

✍ Scribed by Hoping, M.; Schildknecht, C.; Gargouri, H.; Riedl, T.; Tilgner, M.; Johannes, H.-H.; Kowalsky, W.

Book ID: 126267502
Publisher: American Institute of Physics
Year: 2008
Tongue: English
Weight: 508 KB
Volume: 92
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.2936301

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