✦ LIBER ✦

Transistor frequency meter for measuring the thickness and growth rate of films

✍ Scribed by V. T. Nikolaev; V. N. Chernyaev

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Criteria for evaluating the precision in

✍ A. I. Sergeeva 📂 Article 📅 1979 🏛 Springer US 🌐 English ⚖ 189 KB

A method for the continuous measurement

📂 Article 📅 1964 🏛 Elsevier Science 🌐 English ⚖ 86 KB

Possibilities and limitations of the sty

✍ H.L. Eschbach; F. Verheyen 📂 Article 📅 1974 🏛 Elsevier Science 🌐 English ⚖ 707 KB

The syncang method for simultaneous meas

✍ D.J. Walter 📂 Article 📅 1974 🏛 Elsevier Science 🌐 English ⚖ 254 KB

Techniques for ellipsometric measurement

✍ William A. McGahan; Blaine Johs; John A. Woollam 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 307 KB

A transistorized, frequency modulated pr

✍ W.C. Olsen 📂 Article 📅 1964 🏛 Elsevier Science ⚖ 539 KB